Founded in 1990, China Wudung Optics Co., Ltd. is an innovative optics technology electron microscope, scanning electron microscope, scanning electron microscopy, transmission electron microscope, transmission electron microscopy designer and manufacturer, which is engaging in photoelectric instruments and optic instruments. After about 20 years' development, our company has the capacity of complete machine process, spray-paint on surface, electron process, optics assembling. We have own custom electron microscopes review, research and development center, production line, marketing and after-sales service department and molding, injection, painting and silk printing workshops. About 60% of our orders are OEM or ODM. We can offer you R&D services that cover market research, design, mold making, samples, trial production and market testing.

This instrument is usually a normal TEM which has an added scanning system. Instead of a single focused beam of electrons, a small spot is scanned across the specimen and the image is collected on a detector beneath the specimen. This instrument is very useful for the X-Ray microanalysis (EDS) of very small parts of thin specimens.
All specimens give off X-Rays when they are irradiated by an electron beam. These X-Rays can be collected by detectors and used to identify and quantify the different elements present in the specimen. This can be done in two ways. By detecting and measuring X-Rays of a particular wavelength, this is Wavelength Dispersive Spectroscopy (WDS) or by collecting X-Rays of different energy in Energy Dispersive Spectroscopy (EDS). The spectrometers fitted to a microscope to carry out WDS have special crystals in them to deflect the X-Ray beam into the detectors. These are exceedingly expensive and complicated instruments to operate. They are generally referred to as Microprobes. Microprobes can give very accurate quantitative information.

We offer a range of advanced scanning electron microscopes (SEM) to meet user-specific requirements. An FEI scanning electron microscope can scan the surface of a sample with a finely focused electron beam to produce an image from the beam-specimen interactions detected by a wide array of detectors. There are a wide range of detectors from secondary electron detectors to give surface information to backscattered detectors for compositional information that work in high or low vacuum modes. Accessories such as energy dispersive spectrometry (EDS), wavelength dispersive spectrometry (WDS) and electron backscattered diffraction (EBSD) can also be added to any FEI SEM to enable chemical data collection. All systems can also accommodate cryo stages to look at frozen materials and some can accommodate hot or cold stages for watching dynamic experiments